Real-time nanoparticle particle size monitoring device

Performance quality of many industrial materials depends on consistent distribution of particle sizes within the material.  The ability to quantify other parameters such as surface roughness, surface area, and particle shape is also desirable.  Current methods provide a static, batched measurement of limited utility.  This new method and device provides real-time measurements directly from the manufacturing line flow.

This device has demonstrated performance on paper additive products with aspect ratios ranging from 2 to 8 and short axis diameters between 100 and 500 nm.  Applications are in quality control.

Inventors: Mike Mason, David Neivandt

Technology Reference 2011-08

Patents:  Provisional expired, undisclosed.

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